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Volumn Pt A, Issue , 1997, Pages

Image analysis: A powerful tool to pinpoint defects and gauge print quality

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DEFECTS; FAST FOURIER TRANSFORMS; IMAGE ANALYSIS; PAPER SHEETING; PROCESS CONTROL; QUALITY CONTROL; SURFACE ROUGHNESS;

EID: 0031370796     PISSN: 03166732     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (0)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.