Window and cavity breakdown caused by high power microwaves

Digest of Technical Papers-IEEE International Pulsed Power Conference

Volumn 1, Issue , 1997, Pages 135-140

  Neuber, A ^a   Dickens, J ^a   Hemmert, D ^a   Krompholz, H ^a   Hatfield, L L ^a   Kristiansen, M ^a  

^a TEXAS TECH UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN; ELECTRIC FIELDS; ELECTRIC VARIABLES MEASUREMENT; MAGNETRONS; RESONATORS; SURFACE DISCHARGES; WAVEGUIDES;

MICROWAVE BREAKDOWN; S BAND TRAVELLING WAVE RESONATOR; SURFACE COATINGS;

MICROWAVES;

EID: 0031370439     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)