Study on deep level traps in p-HgCdTe with DLTFS

Materials Research Society Symposium - Proceedings

Volumn 484, Issue , 1997, Pages 347-352

  Kawata, S ^a   Sugiyama, I ^a   Kajihara, N ^a   Miyamoto, Y ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COOLING; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; DEEP LEVEL TRANSIENT SPECTROSCOPY; FOURIER TRANSFORMS; MERCURY (METAL); SEMICONDUCTOR DIODES;

DEEP LEVEL TRANSIENT FOURIER SPECTROSCOPY; MERCURY CADMIUM TELLURIDE; SIGNAL INTENSITY;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0031370087     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-484-347     Document Type: Conference Paper

References (6)