Valuation of yield management investments

IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop

Volumn , Issue , 1997, Pages 1-7

  Wang, Eric ^a   Holtan, Marius ^a   Akella, Ram ^a   Emami, Iraj ^a   McIntyre, Mike ^a   Jensen, Dave ^a   Fletcher, Dave ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTAMINATION; COSTS; FABRICATION; MANAGEMENT; OPERATIONS RESEARCH; VALUE ENGINEERING;

COST OF OWNERSHIP MODEL; VALUATION; YIELD LEARNING CYCLE; YIELD MANAGEMENT INVESTMENTS;

SEMICONDUCTOR DEVICE MODELS;

EID: 0031368295     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)