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Journal of Applied Physics

Volumn 82, Issue 11, 1997, Pages 5484-5487

Determination of the crystallographic orientation of CuInSe2 thin films by Raman and infrared spectroscopy

(5) Vorlicek V a Zelezny V a Tiwari, A N b Krejci, M b Zogg, H b

a INSTITUTE OF PHYSICS (Czech Republic)

b ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; CRYSTAL ORIENTATION; INFRARED SPECTROSCOPY; RAMAN SPECTROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTING SILICON; SUBSTRATES; X RAY DIFFRACTION;

COPPER INDIUM SELENIDE; INFRARED TRANSMISSION SPECTROSCOPY;

SEMICONDUCTING FILMS;

EID: 0031367434 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.365576 Document Type: Article

Times cited : (6)

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