Low-melting-point titanium-base brazing alloys-part 2: Characteristics of brazing Ti-21Ni-14Cu on Ti-6Al-4V substrate

Journal of Materials Engineering and Performance

Volumn 6, Issue 6, 1997, Pages 797-803

  Chang, E ^a   Chen, C H ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Brazing; Diffusion; Electrochemical property; Microstructure; Titanium

Indexed keywords

CURRENT DENSITY; DIFFUSION IN SOLIDS; ELECTROCHEMICAL CORROSION; INTERMETALLICS; METALLOGRAPHIC MICROSTRUCTURE; OPTICAL MICROSCOPY; PASSIVATION; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TITANIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CORROSION CURRENT DENSITY; WIDMANSTATTEN STRUCTURE;

BRAZING FILLER METALS;

EID: 0031367299     PISSN: 10599495     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11665-997-0084-2     Document Type: Article

References (8)

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