Analysis of GaAs HBT failure mechanisms: Impact on life test strategy

Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 1997, Pages 182-186

  Maneux, C ^a   Labat, N ^a   Saysset, N ^a   Touboul, A ^a   Danto, Y ^a   Dumas, J M ^a   Launay, P ^a   Dangla, J ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; FAILURE ANALYSIS; OHMIC CONTACTS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE TESTING;

LIFE TEST STRATEGY;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0031366749     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)