Infrared photoemission microscope as a tool for semiconductor device failure analysis

Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 1997, Pages 21-26

  Trigg, A D ^a  

^a INSTITUTE OF MICROELECTRONICS   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ENERGY GAP; INFRARED RADIATION; MICROSCOPES; PHOTOCATHODES; PHOTOEMISSION; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR JUNCTIONS;

CADMIUM MERCURY TELLURIDE; INFRARED PHOTOEMISSION MICROSCOPE (IRPEM); SUBSCRIBER LINE INTERFACE CIRCUITS (SLIC);

INTEGRATED CIRCUIT TESTING;

EID: 0031366745     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)