Characterization testing of dual junction GaInP2/GaAs/Ge solar cell assemblies

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1997, Pages 805-810

  Brown, Michael R ^a   Goldhammer, Leland J ^a   Goodelle, George S ^a   Lortz, Charlene U ^a   Perron, John N ^a   Powe, Joseph S ^a   Schwartz, Joel A ^a   Cavicchi, B Terence ^a   Gillanders, Mark S ^a   Krut, Dmitri D ^a  

^a BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMMUNICATION SATELLITES; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING GERMANIUM; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DOPING; SEMICONDUCTOR JUNCTIONS;

DUAL JUNCTION SOLAR ARRAYS;

SOLAR CELL ARRAYS;

EID: 0031366518     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)