Comments on "nonparametric segmentation of curves into various representations"

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 19, Issue 12, 1997, Pages 1391-1392

  Kanatani, Kenichi ^a  

^a GUNMA UNIVERSITY   (Japan)

Author keywords

Conic fitting; Curve segmentation; Geometric aic; Line fitting; Pattern recognition

Indexed keywords

CURVE FITTING; FEATURE EXTRACTION; PROBLEM SOLVING;

CONIC FITTING; LINE FITTING; NONPARAMETRIC CURVE SEGMENTATION;

IMAGE SEGMENTATION;

EID: 0031366268     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.643901     Document Type: Article

References (10)

1. H. Akaike, "A New Look at the Statistical Model Identification," JEEE Trans. Automation Control, vol. 19, no. 6, pp. 716-723,1974.
2. K.L. Boyer, M.J. Mirza, and G. Ganguly, "The Robust Sequential Estimator: A General Approach and Its Application to Surface Organization in Range Data," JEEE Trans. Pattern Analysis and Machine Intelligence, vol. 16, no. 10, pp. 987-1,001, Oct. 1994.
3. K. Kanatani, "Statistical Bias of Conic Fitting and Renormalization," JEEE Trans. Pattern Analysis and Machine Intelligence, vol. 16, no. 3, pp. 320-326, Mar. 1994.
4. K. Kanatani, Statistical Optimization for Geometric Computation: Theory and Practice. Amsterdam: Elsevier Science, 1996.
5. K. Kanatani, "Comments on 'Symmetry as a Continuous Feature/" JEEE Trans. Pattern Analysis and Machine Intelligence, in press.
6. Y. Kanazawa and K. Kanatani, "Optimal Line Fitting and Reliability Evaluation," IEICE Trans. Information and Systems, vol. E79D, no. 9, pp. 1,317-1,322, Sept. 1996.
7. Y. Kanazawa and K. Kanatani, "Optimal Conic Fitting and Reliability Evaluation," IEICE Trans. Information and Systems, vol. E79D, no. 9, pp. 1,323-1,328, Sept. 1996.
8. P.L. Rosin and G.A.W. West, "Nonparametric Segmentation of Curves Into Various Representations," JEEE Trans. Pattern Analysis and Machine Intelligence, vol. 17, no. 12, pp. 1,140-1,153, Dec. 1995.
9. I. Triono and K. Kanatani, "Automatic Recognition of Regular Figures by Geometric AIC," Proc. IAPR Workshop Machine Vision Applications, pp. 393-396, Tokyo, Nov. 1996.
10. R. Zabrodsky, S. Peleg, and D. Avnir, "Symmetry as a Continuous Feature," JEEE Trans. Pattern Analysis and Machine Intelligence, vol. 17, no. 12, pp. 1,154-1,166, Dec. 1995.