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Volumn 46, Issue 12, 1997, Pages 1363-1371

A comprehensive reconfiguration scheme for fault-tolerant VLSI/WSI array processors

Author keywords

Performance analysis; Reconfiguration process; Redundancy scheme; Switch programming; VLSI WSI array processor; Yield simulation

Indexed keywords

ALGORITHMS; COMPUTER HARDWARE; COMPUTER PROGRAMMING; COMPUTER SIMULATION; COMPUTER SYSTEM RECOVERY; FAULT TOLERANT COMPUTER SYSTEMS; PERFORMANCE; PROBABILITY; SOFTWARE ENGINEERING; SWITCHING CIRCUITS; WSI CIRCUITS;

EID: 0031366107     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.641936     Document Type: Article
Times cited : (57)

References (15)
  • 1
    • 33747053815 scopus 로고
    • Wafer-Scale Integration: Architectures and Algorithms
    • Apr.
    • Computer, Special Issue on Wafer-Scale Integration: Architectures and Algorithms, vol. 25, no. 4, Apr. 1992.
    • (1992) Computer , vol.25 , Issue.4 SPEC. ISSUE
  • 2
    • 33747083680 scopus 로고
    • An Efficient Switching Network Fault Diagnosis for Reconfigurable VLSI/WSI Array Processors
    • Jan.
    • Y.Y. Chen, C.H. Cheng, and J. E. Chen, "An Efficient Switching Network Fault Diagnosis for Reconfigurable VLSI/WSI Array Processors," Proc. IEEE Eighth Int'l Conf. VLSI Design, Jan. 1995.
    • (1995) Proc. IEEE Eighth Int'l Conf. VLSI Design
    • Chen, Y.Y.1    Cheng, C.H.2    Chen, J.E.3
  • 3
    • 0022719974 scopus 로고
    • On Yield, Fault Distribution, and Clustering of Particles
    • May
    • C.H. Stapper, "On Yield, Fault Distribution, and Clustering of Particles," IBM J. Research and Development, vol. 30, pp. 326-338, May 1986.
    • (1986) IBM J. Research and Development , vol.30 , pp. 326-338
    • Stapper, C.H.1
  • 4
    • 0027607627 scopus 로고
    • A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits
    • June
    • I. Koren, Z. Koren, and C.H. Stapper, "A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits," IEEE Trans. Computers, vol. 42, no. 6, pp. 724-733, June 1993.
    • (1993) IEEE Trans. Computers , vol.42 , Issue.6 , pp. 724-733
    • Koren, I.1    Koren, Z.2    Stapper, C.H.3
  • 5
    • 0025890731 scopus 로고
    • Combining Switch and Site Yield for Soft-Configurable WSI
    • Jan.
    • M. Blatt, "Combining Switch and Site Yield for Soft-Configurable WSI," Proc. Int'l Conf. Wafer-Scale Integration, pp. 97-103, Jan. 1991.
    • (1991) Proc. Int'l Conf. Wafer-Scale Integration , pp. 97-103
    • Blatt, M.1
  • 6
    • 0026853567 scopus 로고
    • Configuring a Wafer-Scale Two-Dimensional Array of Single-Bit Processors
    • Apr.
    • A. Boubekeur, J-L Patry, and G. Saucier, "Configuring a Wafer-Scale Two-Dimensional Array of Single-Bit Processors," Computer, pp. 29-39, Apr. 1992.
    • (1992) Computer , pp. 29-39
    • Boubekeur, A.1    Patry, J.-L.2    Saucier, G.3
  • 7
    • 0026742682 scopus 로고
    • Reconfiguration Strategies for VLSI Processor Arrays and Trees Using a Modified Diogenes Approach
    • Jan.
    • K.P. Belkhale and P. Banerjee, "Reconfiguration Strategies for VLSI Processor Arrays and Trees Using a Modified Diogenes Approach," IEEE Trans. Computers, vol. 41, no. 1, pp. 83-96, Jan. 1992.
    • (1992) IEEE Trans. Computers , vol.41 , Issue.1 , pp. 83-96
    • Belkhale, K.P.1    Banerjee, P.2
  • 8
    • 0022700797 scopus 로고
    • A Fault-Tolerant Modular Architecture for Binary Trees
    • Apr.
    • A.S.M. Hassan and V.K. Agarwal, "A Fault-Tolerant Modular Architecture for Binary Trees," IEEE Trans. Computers, vol. 35, no. 4, pp. 356-361, Apr. 1986.
    • (1986) IEEE Trans. Computers , vol.35 , Issue.4 , pp. 356-361
    • Hassan, A.S.M.1    Agarwal, V.K.2
  • 10
    • 0028449220 scopus 로고
    • Modeling the Reliability of a Class of Fault Tolerant VLSI/WSI Systems Based on Multiple-Level Redundancy
    • June
    • Y.Y. Chen and S.J. Upadhyaya, "Modeling the Reliability of a Class of Fault Tolerant VLSI/WSI Systems Based on Multiple-Level Redundancy," IEEE Trans. Computers, vol. 43, no. 6, pp. 737-748, June 1994.
    • (1994) IEEE Trans. Computers , vol.43 , Issue.6 , pp. 737-748
    • Chen, Y.Y.1    Upadhyaya, S.J.2
  • 12
    • 33747060919 scopus 로고
    • Design of a Universal Switching Network for Reconfigurable 2D-Arrays
    • M. Sami and F. Distante, eds., New York: Elsevier Science
    • J.-L. Patry and G. Saucier, "Design of a Universal Switching Network for Reconfigurable 2D-Arrays," Wafer Scale Integration III, M. Sami and F. Distante, eds., pp. 377-391 New York: Elsevier Science, 1990.
    • (1990) Wafer Scale Integration III , pp. 377-391
    • Patry, J.-L.1    Saucier, G.2
  • 13
    • 34250811538 scopus 로고
    • Fault-Tolerant Array Processors Using Single-Track Switches
    • Apr.
    • S.Y. Kung, S.N. Jean, and C.W. Chang, "Fault-Tolerant Array Processors Using Single-Track Switches," IEEE Trans. Computers, vol. 38, no. 4, pp. 501-514, Apr. 1989.
    • (1989) IEEE Trans. Computers , vol.38 , Issue.4 , pp. 501-514
    • Kung, S.Y.1    Jean, S.N.2    Chang, C.W.3
  • 14
    • 0024104959 scopus 로고
    • Interstitial Redundancy: An Area Efficient Fault Tolerance Scheme for Large Area VLSI Processor Arrays
    • Nov.
    • A.D. Singh, "Interstitial Redundancy: An Area Efficient Fault Tolerance Scheme for Large Area VLSI Processor Arrays," IEEE Trans. Computers, vol. 37, no. 11, pp. 1,398-1,410, Nov. 1988.
    • (1988) IEEE Trans. Computers , vol.37 , Issue.11
    • Singh, A.D.1
  • 15
    • 0022792790 scopus 로고
    • VLASIC: A Catastrophic Fault Yield Simulator for Integrated Circuits
    • Oct.
    • D.H. Walker and S.W. Director, "VLASIC: A Catastrophic Fault Yield Simulator for Integrated Circuits," IEEE Trans. Computer-Aided Design of ICs and Systems, vol. 5, no. 4, pp. 541-556, Oct. 1986.
    • (1986) IEEE Trans. Computer-Aided Design of ICs and Systems , vol.5 , Issue.4 , pp. 541-556
    • Walker, D.H.1    Director, S.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.