Effect of oxygen vacancies on transformation of zirconia at low temperatures

Journal of Materials Science

Volumn 32, Issue 24, 1997, Pages 6653-6656

  Lu, Xinying ^a   Liang, Kaiming ^a   Gu, Shouren ^a   Zheng, Yankang ^a   Fang, Hongsheng ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTROCHEMISTRY; PHASE TRANSITIONS; ZIRCONIUM COMPOUNDS;

CRYSTAL VACANCIES;

ZIRCONIA;

EID: 0031365918     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018604504171     Document Type: Article

References (15)

1. R. RUH and H. GARRETT, J. Amer. Ceram. Soc. 50 (1967) 257.
2. R. RUH, "Science and technology of zirconia II", edited by N. Claussen, M. Ruhle and A. H. Heuer (The American Ceramic Society, Columbus, OH, 1984). p. 544.
3. E. G. RAUH and S. P. GARG, J. Amer. Ceram Soc. 63 (1980) 239.
4. M. HILLERT, ibid. 74 (1991) 2005.
5. Y. B. CHENG and D. P. THOMPSON, ibid. 76 (1993) 683.
6. T. SATO and M. SHIMADA, ibid. 67 (1984) C-212.
7. T. SATO, S. OHTAKI and M. SHIMADA, J. Mater. Sci. 20 (1985) 1466.
8. R. M. DICKERSON, M. V. SWAIN and A. H. HEUER, J. Amer. Ceram. Soc. 70 (1987) 214.
9. N. NAKANISHI and T. SHIGEMATSU, J. Mater. Trans. JIM 32 (1991) 779.
10. Idem. ibid. 33 (1992) 318.
11. F. JOLLET, Ph. MAIER, M. GAUTIER, J. P. DURAUD and LEGRESSUA, J. Amer. Ceram. Soc. 71 (1988) C-396.
12. G. GANTOZZI, G. ORANGE, K. M. LIANG, et al. ibid. 72 (1989) 1562.
13. J. F. BAUMARD and P. ABELARD, in "Science and Technology of zirconia II", edited by N. Claussen, M. Ruhle and A. H. Heuer (The American Ceramic Society, Columbus OH, 1983) p. 555.
14. K. M. LIANG, K. F. GU, G. FANTOZZI and C. LEGRESSUS, "Transformation de phase t-m de la zircone sous champ electrique", presented at the 3rd European Interregion Colloquium on Ceramics, 28-30 May 1991. France, private communication.
15. G. FANTOZZI, C. OLAGNON, C. LECUIR, C. LEFRESSUS, G. BLAISE, K. M. LIANG and K. F. GU, "Electric field induced phase transformation in ceramics", presented at the Conference on Electrical Insulation and Dielectric Phenomena, 20-23 October 1991, Texas, USA, private communication.