Assessment of conductive gaskets using X-ray fluorescence technique

Proceedings of the International Conference on Electromagnetic Interference and Compatibility

Volumn , Issue , 1997, Pages 1-2

  Prakash, B N ^a   Roy, L Dinesh ^a  

^a BHARAT ELECTRONICS LIMITED   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC SHIELDING; ELECTROMAGNETIC WAVE INTERFERENCE; FLUORESCENCE; MATERIALS TESTING; X RAY ANALYSIS;

CONDUCTIVE GASKETS; SHIELDING EFFECTIVENESS TESTING;

CONDUCTIVE MATERIALS;

EID: 0031365406     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)