Field emission characteristics of defective diamond films

Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC

Volumn , Issue , 1997, Pages 518-522

  Park, Kyung Ho ^a   Lee, Soonil ^a   Song, Kug Hyun ^a   Park, Jung Il ^a   Park, Kwang Ja ^a   Han, Seok Yoon ^a   Na, Seong Jun ^a   Lee, Nam Yang ^a   Koh, Ken Ha ^a  

^a Ajou University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL DEFECTS; CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELDS; ELECTRON EMISSION; FILM GROWTH; GRAIN SIZE AND SHAPE; PLASMA APPLICATIONS; RAMAN SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS;

MICROWAVE PLASMA CHEMICAL VAPOR DEPOSITION (MPCVD);

DIAMOND FILMS;

EID: 0031364963     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)