Experimental determination of positron related surface characteristics of 6H-SiC

Materials Science Forum

Volumn 255-257, Issue , 1997, Pages 711-713

  Nangia, A ^a   Kim, J H ^a   Weiss, A H ^a   Brauer, G ^b  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

^b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

Diffusion; Positron; Re Emission; Silicon Carbide; Surface; Work Function

Indexed keywords

ANNEALING; DIFFUSION IN SOLIDS; ION IMPLANTATION; PARTICLE BEAM DYNAMICS; SPUTTERING; SURFACE CLEANING; SURFACE PROPERTIES; VACUUM APPLICATIONS;

POSITRON RE EMISSION YIELD;

SILICON CARBIDE;

EID: 0031364962     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.255-257.711     Document Type: Article

References (7)

1. J. Störmer, A. Goodyear, W. Anwand, G. Brauer, P. G. Coleman, W. Triftshauser, J. Phys., Condens. Matter, 8 (1996), L89.
2. G. Brauer, W. Anwand, E.-M., J. Kuriplach, M. Sob, N. Wagner, P. G. Coleman, M. J. Puska and T. Korhonen, Phys. Rev. B 54 (1996), 2512.
3. M. Jibaly, A. Weiss, A.R. Koymen, D. Mehl, L. Stiborek and C. Lei, Phys. Rev. B 44 (1991), 12166.
4. A. Nangia, J. H. Kim, A. H. Weiss, G., Brauer, to be published.
5. P. J. Schultz and K. G. Lynn, Rev. of Mod. Phys. 60 (1988) 701 and references therein.
6. G.Brauer, W. Anwand, P. G. Coleman, A. P. Knights, F. Plazaola, Y. Pacaud, W. Skorupa, J. Störmer and P. Willutzki, Phys. Rev. B 54 (1996) 3084.
7. Alex Weiss, E. Jung, J. H. Kim, A. Nangia, R. Venkataraman, S. Starnes, G. Brauer, Appl. Surf. Sci. 116 (1997) 311.