Scalar cost function for analyzing the quality of totally self-checking design methodologies

Proceedings of the Annual IEEE International Conference on Innovative Systems in Silicon

Volumn , Issue , 1997, Pages 196-200

  Bolchini, C ^a   Salice, F ^a   Sciuto, D ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; INTEGRATED CIRCUIT TESTING; PROBABILITY;

TOTALLY SELF CHECKING (TSC) COMBINATIONAL DEVICES;

COMBINATORIAL CIRCUITS;

EID: 0031364928     PISSN: 10632204     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)