Analytical model and qualitative analysis of the interface-trap charge pumping characteristics of MOS structure

Proceedings of the International Conference on Microelectronics

Volumn 2, Issue , 1997, Pages 605-610

  Habas, Predrag ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ENERGY GAP; INTERFACES (MATERIALS); MATHEMATICAL MODELS;

INTERFACE TRAP CHARGE PUMPING;

MOS DEVICES;

EID: 0031364807     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)