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Volumn , Issue , 1997, Pages 177-180
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Accurate de-embedding of the contribution of the test boards to the high-frequency characteristics of backplane connectors
a
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRIC NETWORK PARAMETERS;
PRINTED CIRCUIT BOARDS;
SEMICONDUCTOR DEVICE MODELS;
MULTIPINS BACKPLANE CONNECTORS;
ELECTRIC CONNECTORS;
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EID: 0031364659
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (0)
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