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Volumn 49, Issue 1-4, 1997, Pages 7-12

More insights from CPM and PDS: Charged and neutral defects in a-Si:H

Author keywords

a Si:H; CPM; Numerical simulation; PDS

Indexed keywords

ABSORPTION; AMORPHOUS SILICON; ANNEALING; COMPUTER SIMULATION; DEGRADATION; ELECTRONIC DENSITY OF STATES; HYDROGENATION;

EID: 0031364608     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(97)00169-4     Document Type: Article
Times cited : (4)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.