High-temperature strain measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2921, Issue , 1997, Pages 244-249

  Silva, Nilton M ^a   Lourenco, Osmar R ^a   Gomes, Paulo d ^a   Mansur, Tanius R ^a  

^a CENTRO DE DESENVOLVIMENTO DA TECNOLOGIA NUCLEAR   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; DEFORMATION; HIGH TEMPERATURE PROPERTIES; HOLOGRAPHIC INTERFEROMETRY; LASER PULSES; VIBRATIONS (MECHANICAL); VIDEO CAMERAS; WAVEFRONTS;

DIGITAL DOUBLE PULSED HOLOGRAPHIC INTERFEROMETRY; PHASE DIFFERENCE;

STRAIN MEASUREMENT;

EID: 0031364577     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)