Efficient critical area estimation for arbitrary defect shapes

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 1997, Pages 20-28

  Allan, Gerard A ^a   Walton, Anthony J ^a  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; COMPUTER AIDED NETWORK ANALYSIS; COMPUTER AIDED SOFTWARE ENGINEERING; FILE EDITORS; INTEGRATED CIRCUIT LAYOUT; INTERACTIVE COMPUTER SYSTEMS; SEMICONDUCTOR DEVICE MODELS;

EDINBURGH YIELD ESTIMATOR SAMPLING (EYES) TOOLS;

VLSI CIRCUITS;

EID: 0031364382     PISSN: 10636722     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)