Decreasing the time-to-market through virtual risk assessment and risk mitigation

Proceedings of the International Conference on Microelectronics

Volumn 1, Issue , 1997, Pages 25-30

  Pecht, Michael G ^a   McCluskey, Patrick F ^a   West, Norman W ^a   Azarm, Shapour ^a   Pecht, Judy ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MARKETING; RELIABILITY; RISK ASSESSMENT;

RISK MITIGATION;

ELECTRONICS INDUSTRY;

EID: 0031363875     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)