Measurement of the piezoelectric and electrooptic constants of GaPO4 with a michelson interferometer

Ferroelectrics

Volumn 202, Issue 1-4, 1997, Pages 307-311

  Krispel, F ^a   Schleinzer, G ^a   Krempl, P W ^a   Wallnofer W ^a  

^a AVL LIST GMBH   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL EFFECTS; GALLIUM COMPOUNDS; HIGH TEMPERATURE EFFECTS; INTERFEROMETERS; PIEZOELECTRICITY;

GALLIUM ORTHOPHOSPHATE; INVERSE PIEZOELECTRIC EFFECTS; MICHELSON INTERFEROMETERS;

PIEZOELECTRIC MATERIALS;

EID: 0031363833     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199708213489     Document Type: Article

References (5)

1. P. W. Krempl, these proceedings
2. th EFTF, Besançon (1995), 66-70
3. G. Schleinzer, Elektrooptische Eigenschaften von Galliumorthophosphat, Diplomarbeit, TU-Graz (1995)
4. W. Belitsch, Temperaturverhalten der piezoelektrischen Konstanten von Quarzhomöotypen, Diplomarbeit, Uni-Graz (1993)
5. nd EFTF, Neuchatel (1988), 827-832