Structural and electrical characterization of thin Bi2Te3 films grown with MBE

International Conference on Thermoelectrics, ICT, Proceedings

Volumn , Issue , 1997, Pages 97-100

  Kikuchi, Satoru ^a   Iwata, Yuji ^a   Hatta, Eiji ^a   Nagao, Jiro ^a   Mukasa, Koichi ^a  

^a TOKAI UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL ORIENTATION; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CONDUCTIVITY OF SOLIDS; FILM GROWTH; HALL EFFECT; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING BISMUTH COMPOUNDS; SEMICONDUCTOR GROWTH; X RAY CRYSTALLOGRAPHY;

DIFFRACTION PEAKS; FULL WIDTH AT HALF MAXIMUM (FWHM);

SEMICONDUCTING FILMS;

EID: 0031363712     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)