Advanced simulation techniques applied to microengineered eddy current sensor

Proceedings of the Australian Microelectronics Conference

Volumn , Issue , 1997, Pages 205-210

  Isterling, W M ^a   Samaan, N D ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE MATERIALS; CRACK PROPAGATION; EDDY CURRENTS; ELECTRIC COILS; ELECTROMAGNETIC FIELDS; FINITE ELEMENT METHOD; SENSORS;

CRACK DETECTION; EDDY CURRENT SENSOR; MICRO COIL;

COMPUTER SIMULATION;

EID: 0031363567     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)