Beyond MRT

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3063, Issue , 1997, Pages 214-222

  Burroughs Jr , Ellis E ^a   Driggers, Ronald G ^a   Halford, Carl E ^a   Manzardo, Mark A ^a  

^a Redstone Technical Test Center   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OBJECT RECOGNITION; OPTICAL SENSORS; TEMPERATURE MEASUREMENT;

DYNAMIC INFRARED SCENE PROJECTION; FORWARD LOOKING INFRARED SENSORS; MINIMUM RESOLVABLE TEMPERATURE (MRT);

INFRARED IMAGING;

EID: 0031363215     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)