Test results of a factory calibration technique for nonuniformity correction of an InSb infrared system

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3063, Issue , 1997, Pages 208-213

  Duykers, Gill L ^a  

^a U S ARMY SPACE AND MISSILE DEFENSE COMMAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; SEMICONDUCTING INDIUM COMPOUNDS; SPURIOUS SIGNAL NOISE; TESTING;

FOCAL PLANE ARRAYS; INDIUM ANTIMONIDE; RESIDUAL FIXED PATTERN NOISE;

INFRARED DEVICES;

EID: 0031362606     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)