Performance degradation of folded-cascode CMOS op-amp due to hot-carrier effects

Midwest Symposium on Circuits and Systems

Volumn 1, Issue , 1997, Pages 164-167

  Yu, Chong Gun ^a   Kim, Hyun Joong ^a   Jeong, Woon Dal ^a   Park, Jong Tae ^a  

^a SolarLight Ltd   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; HOT CARRIERS; INTEGRATED CIRCUIT LAYOUT;

FOLDED CASCODE OPERATIONAL AMPLIFIERS;

OPERATIONAL AMPLIFIERS;

EID: 0031361966     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)