Dependence of the conductivity noise of metallic oxide interconnects on the oxygen stoichiometry: A study of LaNiO3-δ

Journal of Physics D: Applied Physics

Volumn 30, Issue 24, 1997, Pages

  Ghosh, Arindam ^a   Raychaudhuri, A K ^a   Sreekala, R ^b   Rajeswari, M ^b   Venkatesan, T ^b  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC VARIABLES MEASUREMENT; ELECTRIC CONDUCTIVITY; OXIDES; OXYGEN; SPURIOUS SIGNAL NOISE; STOICHIOMETRY; TEMPERATURE; THIN FILMS;

CONDUCTIVITY NOISE; LANTHANUM NICKEL OXIDE; METALLIC OXIDE INTERCONNECTS; TEMPERATURE DEPENDENCE;

LANTHANUM COMPOUNDS;

EID: 0031361603     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/30/24/001     Document Type: Article

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