Effect of crystal defects on minority carrier diffusion lengths in 6H SiC

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1997, Pages 975-978

  Hubbard, S M ^a   Tabib Azar, M ^a   Bailey, S ^a   Rybicki, G ^a   Neudeck, P ^a   Raffaelle, R ^a  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL DEFECTS; DATA REDUCTION; DIFFUSION IN SOLIDS; DIODES; ERROR ANALYSIS; IMAGE ANALYSIS; SEMICONDUCTING SILICON COMPOUNDS;

ELECTRON BEAM INDUCED CURRENT (EBIC);

SILICON CARBIDE;

EID: 0031361248     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)