IDDQ testable dynamic PLAs

IEEE International Workshop on IDDQ Testing, Digest of Papers

Volumn , Issue , 1997, Pages 17-22

  Sachdev, M ^a   Kerkhoff, H ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; ELECTRIC CURRENTS; INTEGRATED CIRCUITS; TESTING;

BRIDGING FAULTS; IDDQ TEST;

LOGIC CIRCUITS;

EID: 0031359949     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)