Characterization and modeling of frequency dispersion in amorphous silicon thin film transistors

Materials Research Society Symposium - Proceedings

Volumn 467, Issue , 1997, Pages 881-886

  Slade, H C ^a   Shur, M S ^a   Ytterdal, T ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON EMISSION; ELECTRON ENERGY LEVELS;

AMORPHOUS SILICON THIN FILM TRANSISTORS; ELECTRON TRAPPING; FREQUENCY DISPERSION; POLYSILICON THIN FILM TRANSISTORS;

THIN FILM TRANSISTORS;

EID: 0031359891     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-467-881     Document Type: Conference Paper

References (10)