AFM observation for the change of surface morphology of TPD thin films due to thermal annealing

Synthetic Metals

Volumn 91, Issue 1-3, 1997, Pages 123-124

  Mandai, Makiko ^a   Takada, Kenji ^a   Aoki, Toru ^a   Fujinami, Tatsuo ^a   Nakanishi, Yoichiro ^a   Hatanaka, Yoshinori ^a  

^a SHIZUOKA UNIVERSITY   (Japan)

Author keywords

Atomic force microscopy; Electroluminescence; Surface morphology; Thermal annealing; Thin films; Triphenyldiamine derivative

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; DEPOSITION; DERIVATIVES; ELECTROLUMINESCENCE; MORPHOLOGY; THIN FILMS;

TRIPHENYLDIAMINE DERIVATIVES;

LUMINESCENT DEVICES;

EID: 0031359666     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0379-6779(98)80070-2     Document Type: Article

References (3)

1. C.W. Tang and S.A. VanSlyke, Appl. Phys. Lett., 51 (1987) 913.
2. J. Shi and C.W. Tang, Appl. Phys. Lett., 70 (1997) 1665.
3. Y. Shirota, T. Kobata and N. Noma, Chem. Lett., (1989) 1145.