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Volumn 51, Issue 12, 1997, Pages 1896-1904

Scanning tunneling microscope study of etch pits on highly oriented pyrolytic graphite heated in an atomic absorption electrothermal analyzer

Author keywords

Electrothermal atomizer atomic absorption spectrometry; Graphite surface oxygen reactions; Monolayer etch pits; Scanning tunneling microscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; ARGON; ATOMIC SPECTROSCOPY; ATOMIZATION; DEGRADATION; ETCHING; HIGH TEMPERATURE EFFECTS; INTERCALATION COMPOUNDS; OXYGEN; REACTION KINETICS; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA;

EID: 0031359649     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702971939721     Document Type: Article
Times cited : (10)

References (20)
  • 10
    • 85033279338 scopus 로고    scopus 로고
    • RHK Technology, Inc., Rochester Hills, Michigan
    • RHK Technology, Inc., Rochester Hills, Michigan.
  • 20
    • 0021560839 scopus 로고
    • P. L. Walker, Jr., and P. A. Thrower, Eds. Marcel Dekker, New York
    • R. T. Yang, in Chemistry and Physics of Carbon, P. L. Walker, Jr., and P. A. Thrower, Eds. (Marcel Dekker, New York, 1984), Vol. 19, pp. 163-210.
    • (1984) Chemistry and Physics of Carbon , vol.19 , pp. 163-210
    • Yang, R.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.