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Volumn 473, Issue , 1997, Pages 305-315
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Modeling stress evolution in electromigration
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFUSION IN SOLIDS;
ELECTROMIGRATION;
GRAIN BOUNDARIES;
MATHEMATICAL MODELS;
STRESS RELAXATION;
ATOMIC FLUXES;
ULSI CIRCUITS;
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EID: 0031359024
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-473-305 Document Type: Conference Paper |
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Times cited : (1)
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References (24)
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