A combined positron microprobe - Scanning electron microscope for positron-annihilation spectroscopy with a spatial resolution in the micron range

Materials Science Forum

Volumn 255-257, Issue , 1997, Pages 641-643

  Greif, H ^a   Haaks, M ^a   Holzwarth, U ^a   Mannig U ^a   Tongbhoyai, M ^a   Maier, K ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

Cone Moderator; Copper; Defects; Microbeam; Small Source

Indexed keywords

CHARGED PARTICLES; COPPER; DEFECTS; PARTICLE BEAMS; SCANNING ELECTRON MICROSCOPY; TUNGSTEN;

POSITRON ANNIHILATION SPECTROSCOPY; POSITRON MICROBEAM;

PROBES;

EID: 0031358972     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.255-257.641     Document Type: Article

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