Optical communication channel test using BIST approaches

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 626-635

  Gagnon, Mathieu ^a   Kaminska, Bozena ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; COMMUNICATION CHANNELS (INFORMATION THEORY); INTEGRATED CIRCUIT LAYOUT; INTEGRATED OPTOELECTRONICS; OPTICAL COMMUNICATION EQUIPMENT;

BUILT IN SELF TEST (BIST);

INTEGRATED CIRCUIT TESTING;

EID: 0031358778     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)