Focused ion beam sample preparation of non-semiconductor materials

Materials Research Society Symposium - Proceedings

Volumn 480, Issue , 1997, Pages 39-48

  Phaneuf, M W ^a   Rowlands, N ^a   Carpenter, G J C ^a   Sundaram, G ^a  

^a Fibics Incorporated   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE QUALITY; ION BEAMS; MILLING (MACHINING); SPECIMEN PREPARATION; TRANSMISSION ELECTRON MICROSCOPY;

FOCUSED ION BEAM (FIB) SYSTEMS;

STEEL SHEET;

EID: 0031358550     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-480-39     Document Type: Conference Paper

References (19)