Thermal and electrical imaging of surface properties with high lateral resolution

International Conference on Thermoelectrics, ICT, Proceedings

Volumn , Issue , 1997, Pages 719-725

  Oesterschulze, E ^a   Kassing, R ^a  

^a UNIVERSITY OF KASSEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; IMAGING TECHNIQUES; SCHOTTKY BARRIER DIODES; WAVEGUIDES;

HIGH FREQUENCY SCANNING ELECTRICAL FORCE MICROSCOPY (HFSEFM); SCANNING THERMAL MICROSCOPY (STHM);

PROBES;

EID: 0031358299     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)