Characterization of geometry dependence of SOI MOSFET thermal resistance and capacitance parameters

IEEE International SOI Conference

Volumn , Issue , 1997, Pages 114-115

  Tenbroek, B M ^a   Redman White, W ^a   Lee, M S L ^a   Bunyan, R J T ^a   Uren, M J ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT RESISTANCE; SEMICONDUCTOR DEVICE MODELS; SILICON ON INSULATOR TECHNOLOGY; SPECIFIC HEAT OF SOLIDS;

GEOMETRY DEPENDENCE;

MOSFET DEVICES;

EID: 0031357283     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)