Investigation of radiation sensitivity and post-irradiation thermal sensitivity of MOS transistor

Proceedings of the International Conference on Microelectronics

Volumn 1, Issue , 1997, Pages 357-360

  Odalovic, Mihajlo ^a   Vuckovic, Biljana ^a   Manic, Ivica ^a   Pavlovic, Zoran ^a  

^a UNIVERSITY OF PRI TINA   (Serbia)

Author keywords

[No Author keywords available]

Indexed keywords

GAMMA RAYS; GATES (TRANSISTOR); RADIATION DETECTORS; RADIATION EFFECTS; THERMAL EFFECTS;

RADIATION SENSITIVITY DEPENDENCE; THERMAL RECOVERY;

MOSFET DEVICES;

EID: 0031357057     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)