Structural characterization of SrBi2Ta2O9 thin films

Materials Research Society Symposium - Proceedings

Volumn 477, Issue , 1997, Pages 49-54

  Ching Prado, E ^a   Perez, W ^a   Reynes Figueroa, A ^a   Katiyar, R S ^a   Ravichandran, D ^a   Bhalla, A S ^a  

^a UNIVERSIDAD TECNOLÓGICA DE PANAMÁ   (Panama)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; DEPOSITION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAIN SIZE AND SHAPE; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON; SOL-GELS; STRONTIUM COMPOUNDS; SUBSTRATES; X RAY ANALYSIS;

ENERGY DISPERSIVE X RAY ANALYSIS; MICRO RAMAN SPECTROSCOPY;

THIN FILMS;

EID: 0031356981     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)