|
Volumn , Issue , 1997, Pages 233-238
|
Accelerated vibration life testing of electronic assemblies
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ELECTRON DEVICE TESTING;
FAILURE (MECHANICAL);
FAILURE ANALYSIS;
MECHANICAL TESTING;
VIBRATIONS (MECHANICAL);
ACCELERATED LIFE TESTING;
ELECTRONIC ASSEMBLY TESTING;
VIBRATION TESTING;
RELIABILITY;
|
EID: 0031356245
PISSN: 00739227
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
|
References (5)
|