A new phase extraction algorithm for phase profilometry

Machine Vision and Applications

Volumn 10, Issue 4, 1997, Pages 188-200

  Di Stefano, Luigi ^a,b,h   Boland, Frank ^b,c,d,e,f,g  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b TRINITY COLLEGE DUBLIN   (Ireland)

^c UNIVERSITY COLLEGE DUBLIN   (Ireland)

^d SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

^e UNIVERSITY OF SHEFFIELD   (United Kingdom)

^f Department of Electronic   (Ireland)

^g Electrical Engineering ^*  (Ireland)

^h DEIS   (Italy)

Author keywords

3D optical profilometry; Active ranging; Automatic inspection; Phase profilometry; Structured light

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; DEMODULATION; DIGITAL FILTERS; FOURIER OPTICS; INDUSTRIAL OPTICS; INSPECTION; LIGHT PROPAGATION; OPTICAL FILTERS; PHASE MEASUREMENT; PHASE MODULATION; PRINTED CIRCUIT BOARDS;

OPTICAL PROFILOMETRY;

FEATURE EXTRACTION;

EID: 0031355387     PISSN: 09328092     EISSN: None     Source Type: Journal    
DOI: 10.1007/s001380050071     Document Type: Article

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