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Volumn 476, Issue , 1997, Pages 177-182
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Low-k dielectric integration cost modeling
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL POLISHING;
DEPOSITION;
LITHOGRAPHY;
MATHEMATICAL MODELS;
METALLIZING;
ULSI CIRCUITS;
CHEMICAL MECHANICAL POLISHING;
COST PER WAFER MODEL;
DIELECTRIC MATERIALS;
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EID: 0031355335
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-476-177 Document Type: Conference Paper |
Times cited : (1)
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References (9)
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