Physical characterization and electrical transport in end-group functionalized self-assembled monolayers

Materials Research Society Symposium - Proceedings

Volumn 488, Issue , 1997, Pages 847-852

  Collet, J ^a   Vuillaume, D ^a   Bonnier, M ^a   Bouloussa, O ^a   Rondelez, F ^a   Gay, J M ^a   Kham, K ^a   Chevrot, C ^a  

^a INSTITUT D ELECTRONIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CAPACITANCE MEASUREMENT; COMPOSITION EFFECTS; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON TRANSPORT PROPERTIES; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; METAL INSULATOR BOUNDARIES; MOLECULAR STRUCTURE; MONOMERS; PHOTOCONDUCTIVITY; SILICON WAFERS;

SELF ASSEMBLED MONOLAYERS; X RAY REFLECTIVITY;

MONOLAYERS;

EID: 0031355073     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-488-847     Document Type: Conference Paper

References (9)