Observation and study of latent tracks on the surface of HOPG induced by H+ ions

Radiation Measurements

Volumn 28, Issue 1-6, 1997, Pages 97-100

  Zhai, P J ^a   Xing, Y X ^a   Zhang, Y ^a   Feng, S L ^a   Kang, Y X ^a   Tang, X W ^a   Wang, Y G ^b   Zhao, W J ^b   Yan, S ^b  

^a INSTITUTE OF HIGH ENERGY PHYSICS   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

H+ ions implantation; HOPG (Highly Oriented Pyrolitic Graphite); Scanning tunneling microscope; Surface damage

Indexed keywords

HYDROGEN; ION BOMBARDMENT; ION IMPLANTATION; PARTICLE BEAM TRACKING; RADIATION DAMAGE; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

HIGHLY ORIENTED PYROLITIC GRAPHITE (HOPG); SURFACE TOPOGRAPHY;

GRAPHITE;

EID: 0031354292     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(97)00047-4     Document Type: Article

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