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Volumn 14, Issue 1-4, 1997, Pages 181-191

Pulsed laser deposition of Bi4Ti3O12 thin films and their anomalous imprint characteristics

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BISMUTH COMPOUNDS; CAPACITORS; ELECTRIC SPACE CHARGE; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); LANTHANUM COMPOUNDS; MAGNESIUM; PLATINUM COMPOUNDS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0031353455     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589708019991     Document Type: Article
Times cited : (2)

References (13)
  • 3
    • 0024927761 scopus 로고
    • San Francisco, California IEEE, Piscataway, NJ
    • R. Womack, and D. Tolsch, Proc. of the IEEE Inter. Solid State Conf., San Francisco, California (IEEE, Piscataway, NJ, 1989), p242; R. Moazzami, C. Hu and W. Shepherd, IEEE Electron Device Lett., 11, 454 (1190).
    • (1989) Proc. of the IEEE Inter. Solid State Conf. , pp. 242
    • Womack, R.1    Tolsch, D.2
  • 4
    • 0025508919 scopus 로고
    • R. Womack, and D. Tolsch, Proc. of the IEEE Inter. Solid State Conf., San Francisco, California (IEEE, Piscataway, NJ, 1989), p242; R. Moazzami, C. Hu and W. Shepherd, IEEE Electron Device Lett., 11, 454 (1190).
    • (1190) IEEE Electron Device Lett. , vol.11 , pp. 454
    • Moazzami, R.1    Hu, C.2    Shepherd, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.