Comparison of lumped-element and transmission-line models for thickness-shear-mode quartz resonator sensors

Proceedings of the Annual IEEE International Frequency Control Symposium

Volumn , Issue , 1997, Pages 96-104

  Cernosek, R W ^a   Martin, S J ^a   Hillman, A R ^a   Bandey, H L ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE; MATHEMATICAL MODELS; QUARTZ APPLICATIONS; TRANSMISSION LINE THEORY;

LUMPED ELEMENT MODELS; THICKNESS SHEAR MODE QUARTZ RESONATOR SENSORS; TRANSMISSION LINE MODELS;

CRYSTAL RESONATORS;

EID: 0031351808     PISSN: 01616404     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)