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Volumn 13, Issue 6, 1997, Pages 499-502

Auger Depth Profiling of Carbonized SiC/Si Samples

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COATED MATERIALS; COATING TECHNIQUES; SILICON SOLAR CELLS;

EID: 0031349103     PISSN: 10050302     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.