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Volumn 13, Issue 6, 1997, Pages 499-502
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Auger Depth Profiling of Carbonized SiC/Si Samples
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
COATED MATERIALS;
COATING TECHNIQUES;
SILICON SOLAR CELLS;
REACTION TIME;
SILICON CARBIDE FILMS;
SILICON SUBSTRATE;
SILICON CARBIDE;
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EID: 0031349103
PISSN: 10050302
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (4)
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References (16)
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